Dr. John Parry, Mentor Graphics Corp.
The particular power cycling strategy you choose for high-power semiconductor devices, such as power transistors, diodes, MOSFETs, and IGBTs, during reliability tests can have a significant effect on predicted lifetime results even if the tests have similar initial parameters. Also, how you set up the measurements can affect the results of the power cycling tests. Read more about A New Power-Cycling Strategy for Testing the Reliability of Power Electronics Modules …
